Seica at Electronica 2026: 40 Years of Innovation Shaping the Future of Electronic Test
With 40 years of innovation behind it, Seica continues to advance electronic test through new technologies and integrated solutions. At Electronica 2026, the company will celebrate this milestone by showcasing OPERA, its new open-platform architecture, alongside advanced Flying Probe solutions for semiconductor testing, high-power semiconductor characterization systems, and next-generation automated PCBA testing. Combined with intelligent software, industrial monitoring, and smart manufacturing tools, these technologies reflect Seica’s vision of a more flexible, connected, and efficient manufacturing future.
OPERA represents the evolution of Seica’s open-platform philosophy, combining modular hardware, flexible software, and interoperable technologies within a common architecture designed to adapt to changing testing requirements. Powered by VIVA™, it enables the integration of multiple test methodologies and third-party solutions, helping manufacturers improve efficiency, preserve existing investments, and scale their capabilities over time. At Electronica 2026, visitors to Seica’s booth A4.459 will be able to discover the OPERA Series and see the Pilot VX ULTRA, S20 IS³, and VALID SL systems on display.
Pilot VX ULTRA: High Precision Flying Probe Testing for the Semiconductor Industry
The Pilot VX ULTRA is designed for the high-precision electrical testing and optical inspection of high-density probe cards, combining advanced measurement capabilities with exceptional mechanical accuracy. Its nanometric infrared camera enables the detection of extremely small physical defects, while ultra-fine pitch probing and enhanced Soft Touch and Soft Landing technologies ensure precise, controlled contact with delicate test pads, minimizing the risk of scratches or deformation. Supporting complex test requirements, including fine-pitch structures and demanding contact conditions, the system is designed for engineering validation, prototyping, low-volume production, and process auditing, delivering accurate, repeatable measurements while preserving the integrity of the device under test.
S20:Advanced Characterization of High-Power Semiconductors
The transition toward electric mobility and renewable energy drives the demand for advanced semiconductors like SiC and GaN capable of enduring high thermal and electrical stress. To address this challenge, the Seica S20 platform, first introduced in 2025, continues to evolve as a modular and scalable solution for comprehensive power device testing across R&D and production. The platform integrates two highly specialized systems, including the S20 IS³, which performs precise static and dynamic testing on MOSFETs, IGBTs, and diodes to verify electrical compliance prior to system integration, and the S20 RTH, which measures thermal resistance and power cycling for up to 12 devices in parallel to ensure reliability under extreme conditions. Highlighting this continuous innovation, Seica will unveil a brand-new version of the S20 IS³ at the upcoming electronica exhibition, bringing maximum precision and scalability to accelerate the development of next-generation power electronics.
